Glossary

Structured-light scanning

Structured-light scanning is a non-contact optical method for capturing 3D surface geometry with projected light patterns.

Structured-light scanning is a non-contact optical measurement method that captures three-dimensional surface geometry by projecting known light patterns onto a part and recording how those patterns deform across the surface. Software uses the camera images to calculate a 3D point cloud or mesh that represents the measured shape.

In manufacturing and quality contexts, structured-light scanning is commonly used for dimensional inspection, reverse engineering, tool and die verification, and first article inspection support for complex surfaces. The scan data may be compared to a CAD model, drawing requirements, or selected inspection characteristics when the measurement process, alignment method, and reporting workflow are defined.

Structured-light scanning should not be confused with barcode scanning or document scanning. It is also different from contact CMM inspection: a CMM measures discrete points with a probe, while structured-light scanning captures many surface points optically. Structured-light systems can be useful for freeform or accessible external geometry, but they may be limited by line of sight, surface finish, transparency, reflectivity, feature access, and tolerance requirements.

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